X射线吸收光谱法
X射线光电子能谱
价(化学)
电子结构
吸收光谱法
分析化学(期刊)
扩展X射线吸收精细结构
化学计量学
薄膜
氧烷
密度泛函理论
X射线光谱学
化学
结合能
光谱学
吸收(声学)
材料科学
物理化学
原子物理学
纳米技术
核磁共振
计算化学
光学
物理
复合材料
量子力学
有机化学
色谱法
作者
Jiang Peng,David Prendergast,Ferenc Borondics,Soeren Porsgaard,Lisandro J. Giovanetti,Elzbieta Pach,John T. Newberg,Hendrik Bluhm,Flemming Besenbacher,Miquel Salmerón
摘要
The electronic structure of Cu2O and CuO thin films grown on Cu(110) was characterized by X-ray photoelectron spectroscopy (XPS) and X-ray absorption spectroscopy (XAS). The various oxidation states, Cu0, Cu+, and Cu2+, were unambiguously identified and characterized from their XPS and XAS spectra. We show that a clean and stoichiometric surface of CuO requires special environmental conditions to prevent loss of oxygen and contamination by background water. First-principles density functional theory XAS simulations of the oxygen K edge provide understanding of the core to valence transitions in Cu+ and Cu2+. A novel method to reference x-ray absorption energies based on the energies of isolated atoms is presented.
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