Relaxation energies in XPS and XAES of solid sulfur compounds

Solid sulfur compounds have been investigated by XPS/XAES chemical shift measurements of the S 1s, S 2p, and S KLL peaks. Auger parameters and relaxation energies have been derived. The relaxation energy was discussed in terms of initial state charge and dielectric screening models. A local screening model was used to calculate relaxation energy shifts semiquantitatively. The effect of crystal water has been illustrated. A comparison of trends in the relaxation energy of the third row elements silicon, phosphorus, and sulfur shows striking similarities.