放松(心理学)
硫黄
X射线光电子能谱
化学
电介质
螺旋钻
化学位移
分析化学(期刊)
物理化学
核磁共振
材料科学
原子物理学
有机化学
物理
心理学
社会心理学
光电子学
作者
Heiko Peisert,T. Chassé,P. Streubel,A. Meisel,R. Szargan
标识
DOI:10.1016/0368-2048(94)02129-5
摘要
Solid sulfur compounds have been investigated by XPS/XAES chemical shift measurements of the S 1s, S 2p, and S KLL peaks. Auger parameters and relaxation energies have been derived. The relaxation energy was discussed in terms of initial state charge and dielectric screening models. A local screening model was used to calculate relaxation energy shifts semiquantitatively. The effect of crystal water has been illustrated. A comparison of trends in the relaxation energy of the third row elements silicon, phosphorus, and sulfur shows striking similarities.
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