外推法
光学
领域(数学分析)
洛伦兹变换
显微镜
物理
模式(计算机接口)
材料科学
数学分析
计算机科学
数学
经典力学
操作系统
作者
H.R. Gong,J. N. Chapman
标识
DOI:10.1016/0304-8853(87)90710-4
摘要
In the Fresnel mode of Lorentz microscopy, domain wall widths are often estimated using the linear extrapolation method in which the widths of divergent domain wall images recorded with different defocus distances are extrapolated to zero defocus. This paper examines the validity of the technique for very narrow walls by analysing images synthesized on a computer. The results show that the method is only of limited reliability for the estimation of very narrow wall widths. Methods of improving the accuracy are suggested.
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