Board level reliability of lead‐free designs of BGAs, CSPs, QFPs and TSOPs

球栅阵列 印刷电路板 焊接 锡膏 材料科学 表面贴装技术 温度循环 芯片级封装 铅(地质) 可焊性 冶金 四平无引线包 引线框架 可靠性(半导体) 复合材料 热的 工程类 电气工程 薄脆饼 胶粘剂 量子力学 纳米技术 气象学 地质学 地貌学 图层(电子) 半导体器件 物理 功率(物理)
作者
Meng‐Kuang Huang,Chiapyng Lee
出处
期刊:Soldering & Surface Mount Technology [Emerald (MCB UP)]
卷期号:20 (3): 18-25 被引量:7
标识
DOI:10.1108/09540910810885688
摘要

Purpose The purpose of this paper is to describe the board level reliability test results of four IC packages with lead‐free balls/platings, soldered with lead‐free solder paste, during thermal cycling. The board level reliability test results of tin‐lead balled/plated packages soldered with lead‐free solder paste have also been included for comparison. Design/methodology/approach Four different packages, i.e. ball grid array (BGA), chip scale package (CSP), quad flat package (QFP) and thin small outline package (TSOP), were assembled on a test printed circuit board (PCB) as the test vehicle. Lead‐free and tin‐lead BGA/CSP packages were equipped with Sn‐3.0Ag‐0.5Cu and Sn‐37Pb solder balls, respectively. The lead‐frames of lead‐free QFP/TSOP leaded‐packages were plated with Sn‐58Bi and those of tin‐lead QFP/TSOP leaded‐packages, Sn‐37Pb. The lead‐free solder paste used in this study was Sn‐3.0Ag‐0.5Cu. Two kinds of surface finishes, immersion gold over electroless nickel (Au/Ni) and organic solderability preservative, were used on the PCBs. The test PCBs were thermal cycled 5,000 times within the temperature range of −40 to 125°C and electrically monitored during the thermal cycling. Findings It was found that the tin‐lead balled/plated BGAs, CSPs, QFPs and TSOPs soldered with lead‐free solder paste showed serious board level reliability risks as their abilities to withstand thermal cycling stresses are much weaker than those of entirely lead‐free assemblies. Neither package nor surface finish was found to have any effects on the board level reliability of test vehicles with lead‐free balled/plated BGAs, CSPs, QFPs and TSOPs. Metallographic examinations were conducted to investigate the effect of thermal cycling on the failure modes of solder joints. Originality/value The paper is of value by contributing to research in the use of lead‐free solder paste with lead‐containing packages in the industry. Currently, there is a deficiency of knowledge in this area.
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