拓扑绝缘体
扫描隧道显微镜
角分辨光电子能谱
光电发射光谱学
双层
凝聚态物理
拓扑(电路)
材料科学
铋
电子结构
物理
谱线
化学
量子力学
膜
生物化学
数学
组合数学
冶金
作者
Chun-Lei Gao,Dong Qian,Can-Hua Liu,Jin-Feng Jia,Feng Liu
出处
期刊:Chinese Physics B
[IOP Publishing]
日期:2013-06-01
卷期号:22 (6): 067304-067304
被引量:16
标识
DOI:10.1088/1674-1056/22/6/067304
摘要
Providing the strong spin-orbital interaction, Bismuth is the key element in the family of three-dimensional topological insulators. At the same time, Bismuth itself also has very unusual behavior, existing from the thinnest unit to bulk crystals. Ultrathin Bi (111) bilayers have been theoretically proposed as a two-dimensional topological insulator. The related experimental realization achieved only recently, by growing Bi (111) ultrathin bilayers on topological insulator Bi2Te3 or Bi2Se3 substrates. In this review, we started from the growth mode of Bi (111) bilayers and reviewed our recent progress in the studies of the electronic structures and the one-dimensional topological edge states using scanning tunneling microscopy/spectroscopy (STM/STS), angle-resolved photoemission spectroscopy (ARPES), and first principles calculations.
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