Enhanced hole mobility-lifetime product in selenium-added CdTe compounds

An improved detector performance for 2% selenium-added CdZnTe(CZT) was observed and explained by the reduced concentration of a deep-level hole trap, which was confirmed by photoluminescence measurements of CdZnTeSe(CZTS) and CdTeSe(CTS). The hole lifetime in CZTS was found to be 2.18μs in the selenium-containing material, which is much longer than that typically measured by 10–100 times. The prolonged lifetime of hole carriers is likely caused by the disappearance of hole trapping at a specific binding energy of 1.1-eV below the conduction band. Also, the enhanced pulse height spectra of CZTS gamma-ray detectors were explained in terms of the ratio of electron and hole mobility-lifetime products. Cu-migrated patterns are used for the first time to reveal sub-grains and their networks in CZT and CZTS. Based on qualitative analysis, the Cu-migrated patterns in CZT and CZTS showed similar results.