DNA at conductive interfaces: What can atomic force microscopy offer?

This review is devoted to the analysis of the capabilities of atomic force microscopy (AFM) in the study of the behavior of DNA at conducting solid–liquid and solid-air interfaces under electrochemical control and after the influence of the potential differences. The first part of the review presents the main aspects of AFM, the physical and chemical properties of DNA, and the behavior of DNA at conductive interfaces under the action of an electric field. The second part highlights the main categories of AFM applicability for DNA analysis at conducting interfaces from the point of view of "electrical stimulus-structure", "process-structure", and "process-structure-electrochemical properties" correlation. The applicability of AFM's main capabilities is shown: (i) visualization (of both monolayers and single molecules and hybridization complexes of DNA on a conductive surface), (ii) single-molecule force spectroscopy under electrochemical control, (iii) manipulation of DNA position at the nanoscale level. This review can be a starting point for further multidisciplinary DNA studies at electrochemical interfaces.