退火(玻璃)
材料科学
氧化物
钛酸锶
原子力显微镜
蚀刻(微加工)
热的
氢氧化物
浸出(土壤学)
显微镜
各向同性腐蚀
纳米技术
化学工程
矿物学
复合材料
冶金
薄膜
化学
光学
气象学
土壤科学
土壤水分
工程类
物理
图层(电子)
环境科学
作者
John Connell,Brandon Isaac,G. Ekanayake,Douglas R. Strachan,S. S. A. Seo
摘要
We report that a deionized water etching and thermal annealing technique can be effective for preparing atomically-flat and singly-terminated surfaces of single crystalline SrTiO3 substrates. After a two-step thermal-annealing and deionized-water etching procedure, topography measured by atomic force microscopy shows the evolution of substrates from a rough to step-terraced surface structure. Lateral force microscopy confirms that the atomically-flat surfaces are singly-terminated. Moreover, this technique can be used to remove excessive strontium oxide or hydroxide composites segregated on the SrTiO3 surface. This acid-etchant-free technique facilitates the preparation of atomically-aligned SrTiO3 substrates, which promotes studies on two-dimensional physics of complex oxide interfaces.
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