X射线光电子能谱
硫黄
化学
化学气相沉积
结合能
沉积(地质)
衍射
光电发射光谱学
分析化学(期刊)
结晶学
原子物理学
光学
有机化学
核磁共振
物理
古生物学
沉积物
生物
作者
Ch. Zubrägel,C. Deuper,F. Schneider,M. Neumann,M. Grunze,Andreas Schertel,Ch. Wöll
标识
DOI:10.1016/0009-2614(95)00392-h
摘要
High-resolution photoelectron spectroscopy using photon energies of 200 and 1486 eV is used to reveal the presence of two different sulfur species in alkanethiolate films on Au and Ag surfaces. Self-assembly from a solution in ethanol gave similar results to vapour phase deposition onto clean substrates in ultrahigh vacuum. In addition to chemical differences of the two S species as implied by the 1.3 eV difference in the S 2p binding energies angular-resolved measurements revealed intensity variations caused by photoelectron diffraction. This observation indicates also a geometrical inequivalence of the two sulfur species.
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