达克勒数
原子层沉积
Péclet编号
无量纲量
化学气相沉积
传质
沉积(地质)
化学
化学工程
热力学
材料科学
机械
图层(电子)
纳米技术
物理化学
物理
色谱法
燃烧
生物
沉积物
工程类
古生物学
出处
期刊:Journal of vacuum science & technology
[American Vacuum Society]
日期:2016-12-21
卷期号:35 (1)
摘要
In both chemical vapor deposition (CVD) and atomic layer deposition (ALD) reactors, a substantial fraction of the reactants never react at the substrate and are pumped away. To quantify this, an analytic expression for reactant utilization is derived for an axisymmetric stagnation flow reactor. The utilization is found to depend on the dimensionless Peclet and Damkohler numbers. The highest utilization is seen for CVD processes in the mass transfer limit (Da → ∞). For finite reaction rates, CVD processes always have higher utilization than ALD processes.
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