电场
肖特基二极管
沟槽
光电子学
材料科学
肖特基势垒
阻塞(统计)
工程物理
电气工程
电压
高压
数码产品
功率(物理)
计算机科学
纳米技术
工程类
物理
二极管
图层(电子)
量子力学
计算机网络
作者
Wenshen Li,Debdeep Jena,Huili Grace Xing
标识
DOI:10.1016/bs.semsem.2021.04.002
摘要
The extremely high critical electric field of Ga2O3 makes it an attractive material for power electronics and RF devices that demands high power output. However, reaching the critical electric field in Ga2O3 devices is not a trivial task, especially when native p-type doping is not available. In this chapter, we quantitatively outlined the design challenges through the calculation of practical maximum electric fields in Schottky junction and MOS structures, the two viable alternative voltage-blocking structures in Ga2O3. For effective electric-field management, we proposed two advanced device concepts: the use of high barrier height Schottky junctions and the incorporation of RESURF via trench structures. Both concepts have been verified experimentally and would greatly benefit the release of Ga2O3’s true potential.
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