无杂散动态范围
比较器
逐次逼近ADC
插值(计算机图形学)
量化(信号处理)
计算机科学
动态范围
电子工程
奈奎斯特频率
12位
奈奎斯特率
CMOS芯片
采样(信号处理)
算法
电气工程
工程类
带宽(计算)
电信
电压
探测器
帧(网络)
作者
Jaegeun Song,Yunsoo Park,Chaegang Lim,Yohan Choi,Soonsung Ahn,Sooho Park,Chulwoo Kim
出处
期刊:IEEE Journal of Solid-state Circuits
[Institute of Electrical and Electronics Engineers]
日期:2021-09-16
卷期号:57 (5): 1492-1503
被引量:7
标识
DOI:10.1109/jssc.2021.3111924
摘要
This article presents a 9-bit 500-MS/s 2-bit/cycle successive approximation register (SAR) analog-to-digital converter (ADC) with an error-tolerant interpolation technique. The proposed interpolation technique uses flip-flops to implement a 2-bit/cycle operation in the SAR ADC. By taking advantage of the metastable region of the flip-flop, the proposed interpolator can defer the bit decision when a decision error occurs with a high probability. Because the SAR ADC approximates the signal range step by step, the deferred decisions proceed to the next conversion cycles without any increase in quantization noise. The deferring-decision characteristic increases the error tolerance in the presence of comparator mismatches and increases the inherent linearity of the interpolation technique compared to conventional latch interpolation. A prototype ADC was designed using the 28-nm CMOS technology to verify the effectiveness of the proposed interpolation technique. The measured signal-to-noise-and-distortion ratio (SNDR) and spurious-free dynamic range (SFDR) at the Nyquist rate are 50.6 and 61.4 dB, respectively. The power consumption is 1.87 mW at a sampling frequency of 500 MS/s. The proposed ADC achieves a Walden figure of merit (FoM) of 13.5 fJ/conversion-step.
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