旋转扭矩传递
隧道磁电阻
磁阻随机存取存储器
扭矩
自旋(空气动力学)
隧道枢纽
电气工程
非易失性存储器
CMOS芯片
计算机科学
材料科学
随机存取存储器
物理
光电子学
量子隧道
图层(电子)
纳米技术
工程类
磁场
磁化
计算机硬件
量子力学
热力学
标识
DOI:10.1016/j.jmmm.2022.169479
摘要
A spin-transfer torque switched magnetic tunnel junction (MTJ) is a memory element in modern magnetic random access memory (MRAM), a CMOS-integrated technology that is being developed by semiconductor manufacturers. One electrode of the MTJ acts as a magnetically bi-stable “free-layer” (FL), determining the bit-state of a memory cell. Spin-transfer torque (or spin-torque, or STT) switches the magnetic state of the FL with respect to a reference-layer (RL) in the MTJ. Here I review our current understanding of the MTJ device physics governing spin-transfer-torque driven switching. Starting with some simple concepts based on macrospin assumptions, I will then review recent experimental results, and compare observations with macrospin expectation for a more realistic, observation-based quantitative description, beyond macrospin. I will also describe some unresolved scientific challenges that could further improve the MTJ performance for memory technology, and give a brief outlook.
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