MOSFET
电容
半导体器件建模
功率MOSFET
碳化硅
香料
JFET公司
材料科学
电子工程
功率(物理)
功率半导体器件
场效应晶体管
晶体管
寄生电容
电气工程
工程类
电压
物理
CMOS芯片
电极
量子力学
冶金
作者
Zhuolin Duan,Tao Fan,Xuhui Wen,Dong Zhang
出处
期刊:IEEE Transactions on Power Electronics
[Institute of Electrical and Electronics Engineers]
日期:2017-04-07
卷期号:33 (3): 2509-2517
被引量:79
标识
DOI:10.1109/tpel.2017.2692274
摘要
Silicon carbide (SiC) power metal-oxide-semiconductor field-effect transistors (MOSFETS) have been applied in high-power and high-frequency converters recently. To effectively predict characteristics of SiC power MOSFETS in the design phase, a simple and valid model is needed. In this paper, a simple improved SiC power MOSFET behavioral model is proposed using SPICE language. Key parameters in the model are analyzed and determined in detail, including parasitic parameters of the power module, steady-state characteristic parameters, and nonlinear parasitic capacitances. The effect of negative turn-off gate drive voltage is considered and a continuously differentiable function is proposed to describe the gate-source capacitance. Experimental validation is performed under a double pulse circuit employing an N-channel power MOSFET half-bridge module CAS300M12BM2 (Cree Inc.) rated at 300 A/1200 V. The main switching dynamic characteristic parameters of the model have been compared with those of the measured results. The results show that taking gate-source capacitance as a linear value as most previous models do will cause significant turn-on deviations between experiment and simulation results, while the improved model is more accurate compared with the measured results.
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