小角X射线散射
X射线吸收光谱法
催化作用
材料科学
表征(材料科学)
散射
Atom(片上系统)
纳米技术
吸收(声学)
化学工程
吸收光谱法
化学
计算机科学
物理
光学
有机化学
复合材料
工程类
嵌入式系统
作者
Lingzhe Fang,Söenke Seifert,Randall E. Winans,Tao Li
标识
DOI:10.1002/smtd.202001194
摘要
Single-atom and subnanocluster catalysts (SSCs) represent a highly promising class of low-cost materials with high catalytic activity and high atom-utilization efficiency. However, SSCs are susceptible to undergo restructuring during the reactions. Exploring the active sites of catalysts through in situ characterization techniques plays a critical role in studying reaction mechanism and guiding the design of optimum catalysts. In situ X-ray absorption spectroscopy/small-angle X-ray scattering (XAS/SAXS) is promising and widely used for monitoring electronic structure, atomic configuration, and size changes of SSCs during real-time working conditions. Unfortunately, there is no detailed summary of XAS/SAXS characterization results of SSCs. The recent advances in applying in situ XAS/SAXS to SSCs are thoroughly summarized in this review, including the atomic structure and oxidation state variations under open circuit and realistic reaction conditions. Furthermore, the reversible transformation of single-atom catalysts (SACs) to subnanoclusters/nanoparticles and the application of in situ XAS/SAXS in subnanoclusters are discussed. Finally, the outlooks in modulating the SSCs and developing operando XAS/SAXS for SSCs are highlighted.
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