降级(电信)
光辉
异质结
材料科学
活化能
选择(遗传算法)
加速老化
电流密度
分析化学(期刊)
光电子学
化学
环境科学
光学
物理化学
环境化学
物理
复合材料
电气工程
计算机科学
量子力学
人工智能
工程类
作者
Shigenobu Yamakoshi,Osamu Hasegawa,H. Hamaguchi,Masayuki Abe,Toyoshi Yamaoka
摘要
The slow degradation of single-heterostructure Ga1−xAlxAs LED’s has been investigated. The samples which show the fast degradation are completely rejected by the selection of DLD-free LED’s. Selection procedures and the results of accelerated aging tests for over 10 000 h are presented. The activation energy of the slow degradation is found to be 0.57 eV. Extrapolated room-temperature half-life in excess of 5×106 h is estimated. The degradation coefficients are not affected significantly by the operating current density (3.5–10 kA/cm2).
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