期刊:IEEE Transactions on Geoscience and Remote Sensing [Institute of Electrical and Electronics Engineers] 日期:1992-03-01卷期号:30 (2): 356-369被引量:1073
标识
DOI:10.1109/36.134085
摘要
A backscattering model for scattering from a randomly rough dielectric surface is developed. Both like- and cross-polarized scattering coefficients are obtained. The like-polarized scattering coefficients contain single scattering terms and multiple scattering terms. The single scattering terms are shown to reduce to the first-order solutions derived from the small perturbation method when the roughness parameters satisfy the slightly rough conditions. When surface roughnesses are large but the surface slope is small, only a single scattering term corresponding to the standard Kirchhoff model is significant. If the surface slope is large, the multiple scattering term will also be significant. The cross-polarized backscattering coefficients satisfy reciprocity and contain only multiple scattering terms. The difference between vertical and horizontal scattering coefficients increases with the dielectric constant and is generally smaller than that predicted by the first-order small perturbation model. Good agreements are obtained between this model and measurements from statistically known surfaces.< >