薄脆饼
抛光
材料科学
化学机械平面化
磨料
半导体器件制造
硅
工程物理
半导体
晶圆回磨
纳米技术
粒子(生态学)
机械工程
冶金
光电子学
晶片切割
工程类
海洋学
地质学
作者
Kheelraj Pandey,Ashwani Sharma,Ayush Singh
出处
期刊:Silicon
[Springer Nature]
日期:2022-05-20
卷期号:14 (18): 12031-12047
被引量:6
标识
DOI:10.1007/s12633-022-01940-z
摘要
In today’s polishing industry there is a great demand for obtaining a smooth, extremely flat, and mirror-like and particle free surface of silicon wafer for implanting semiconductor devices over it. In this direction, Chemical Mechanical Polishing (CMP) and its allied processes have played a vital role in the present and past scenario. In this paper, glimpses have been presented to highlight the manufacturing processes of silicon wafers and the finishing processes developed by various researchers to get better surface quality of silicon wafers. An alternative to the CMP process a recently advanced method known as double disk magnetic abrasive finishing (DDMAF) along with its chemically allied processes has been also briefed to the polish silicon wafer.
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