腐蚀
化学机械平面化
材料科学
铜
薄脆饼
吸附
缓蚀剂
表面粗糙度
冶金
化学工程
铜水管的冲蚀腐蚀
表面光洁度
纳米技术
复合材料
抛光
化学
物理化学
工程类
作者
Lianjun Hu,Qi Chen,Qi Fang,Guofeng Pan,Jiting He,Yong Zhang
标识
DOI:10.1016/j.mssp.2024.108141
摘要
During the chemical mechanical planarization (CMP) process, copper (Cu) is susceptible to excessive corrosion, which can lead to an increase in surface roughness of the wafer. In severe cases, this excessive corrosion can result in short circuits, open circuits, and even global interconnect failures. Therefore, this study investigates the inhibitory properties of salicylaldoxime (SA) as a corrosion inhibitor for Cu corrosion through systematic experimental measurements and theoretical calculations. The research findings demonstrate that both SA and SA− exhibit strong molecular activity. They can adsorb onto the surface of Cu through chemical and physical interactions in a parallel or slightly tilted manner, forming inhibitor films that effectively shield against the corrosion caused by corrosive particles. The corrosion inhibition performance of SA is enhanced with increasing concentration. Moreover, SA can react with Cu2+ to form insoluble complexes. It is speculated that these complexes may deposit on the surface of Cu, serving as complementary inhibitor films. These new discoveries provide novel insights and robust support for a better understanding of the corrosion inhibition mechanism of SA and its potential in subsequent practical applications in Cu CMP.
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