耐久性
钙钛矿(结构)
材料科学
光伏系统
降级(电信)
温度测量
光电子学
工程物理
计算机科学
热力学
化学工程
复合材料
电气工程
物理
工程类
电信
作者
Tomoyuki Tobe,Naoyuki Shibayama,Yuiga Nakamura,M. Ikegami,Hiroyuki Kanda,Tsutomu Miyasaka
标识
DOI:10.1002/asia.202400686
摘要
Perovskite solar cells are actively investigated for their potential as highly efficient and cost-effective photovoltaic devices. However, a significant challenge in their practical application is enhancing their durability. Particularly, these cells are expected to be subjected to heating by sunlight in real-world operating environments. Therefore, high-temperature durability and device operation under such conditions are critical. Our study aims to improve the durability of perovskite solar cells for practical applications by examining their temperature coefficients at elevated temperatures using MA-free compositions. We assessed these coefficients and investigated their correlation with the ideality factor, revealing that carrier recombination markedly affects the temperature behavior of these cells. Our methodology involves simple J-V measurements to evaluate device degradation at high temperatures, paving the way for further research to enhance device performance in such environments.
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