微波食品加热
反射(计算机编程)
反射损耗
分歧(语言学)
电阻抗
互惠的
电磁辐射
高斯
光学
数学分析
物理
计算机科学
数学
量子力学
哲学
程序设计语言
语言学
作者
Ying Liu,Kun Zhao,Michael G. B. Drew,Yue Liu
出处
期刊:AIP Advances
[American Institute of Physics]
日期:2018-01-01
卷期号:8 (1)
被引量:67
摘要
Reflection loss is usually calculated and reported as a function of the thickness of microwave absorption material. However, misleading results are often obtained since the principles imbedded in the popular methods contradict the fundamental facts that electromagnetic waves cannot be reflected in a uniform material except when there is an interface and that there are important differences between the concepts of characteristic impedance and input impedance. In this paper, these inconsistencies have been analyzed theoretically and corrections provided. The problems with the calculations indicate a gap between the background knowledge of material scientists and microwave engineers and for that reason a concise review of transmission line theory is provided along with the mathematical background needed for a deeper understanding of the theory of reflection loss. The expressions of gradient, divergence, Laplacian, and curl operators in a general orthogonal coordinate system have been presented including the concept of reciprocal vectors. Gauss’s and Stokes’s theorems have been related to Green’s theorem in a novel way.
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