Printing Semiconductor–Insulator Polymer Bilayers for High‐Performance Coplanar Field‐Effect Transistors

Abstract Source–semiconductor–drain coplanar transistors with an organic semiconductor layer located within the same plane of source/drain electrodes are attractive for next‐generation electronics, because they could be used to reduce material consumption, minimize parasitic leakage current, avoid cross‐talk among different devices, and simplify the fabrication process of circuits. Here, a one‐step, drop‐casting‐like printing method to realize a coplanar transistor using a model semiconductor/insulator [poly(3‐hexylthiophene) (P3HT)/polystyrene (PS)] blend is developed. By manipulating the solution dewetting dynamics on the metal electrode and SiO 2 dielectric, the solution within the channel region is selectively confined, and thus make the top surface of source/drain electrodes completely free of polymers. Subsequently, during solvent evaporation, vertical phase separation between P3HT and PS leads to a semiconductor–insulator bilayer structure, contributing to an improved transistor performance. Moreover, this coplanar transistor with semiconductor–insulator bilayer structure is an ideal system for injecting charges into the insulator via gate‐stress, and the thus‐formed PS electret layer acts as a “nonuniform floating gate” to tune the threshold voltage and effective mobility of the transistors. Effective field‐effect mobility higher than 1 cm 2 V −1 s −1 with an on/off ratio > 10 7 is realized, and the performances are comparable to those of commercial amorphous silicon transistors. This coplanar transistor simplifies the fabrication process of corresponding circuits.