В. А. Лабунов,Vitaly Bondarenko,I. Glinenko,A. M. Dorofeev,Л. В. Табулина
出处
期刊:Thin Solid Films [Elsevier] 日期:1986-03-01卷期号:137 (1): 123-134被引量:101
标识
DOI:10.1016/0040-6090(86)90200-2
摘要
The effect of a typical pre-epitaxial heat treatment in H2 atmosphere at 1000–1200°C on porous silicon (PS) was investigated. As-grown PS possesses the monocrystalline structure of the original n+-Si substrate with a relative lattice deformation up to 4 x 10−4, a developed system of vertical pores 3–16 nm in diameter and a specific surface area of about 100–200 m2 cm−3. The heat treatment of the PS results in the rearrangement of its crystalline structure, the modification of its lattice deformation and a decrease in its specific surface area to a value of 10m2 cm−3. Simultaneously the pores are essentially modified in form, size and quantity. The phenomena described can be explained as the result of the sintering of PS under the heat treatment.