2-D Material Molybdenum Disulfide Analyzed by XPS

Molybdenum disulfide (MoS2), a two-dimensional material purchased from SPI supplies, was analyzed using high-resolution X-ray photoelectron spectroscopy (XPS). A flake was mechanically exfoliated from a MoS2 bulk single crystal for the study. The XPS spectra of MoS2 obtained using monochromatic Al Kα radiation at 0.83401 nm include a survey scan, high-resolution spectra of O 1s, Mo 3p, C 1s, Mo 3d, S 2s, S 2p, Mo 4s, Mo 4p, S 3s, and valance band. Extended energy ranges were collected in the vicinity of the Mo 3d/S 2s, S 2p, and Mo 4s/Mo 4p/S 3s/Valence band regions allowing for fitting of surface plasmon features and determination of Tougaard scattering cross-section parameters. Quantitative analysis indicates a surface composition of MoS1.9.