Multislice Electron Tomography Using Four-Dimensional Scanning Transmission Electron Microscopy

Electron tomography offers important three-dimensional (3D) structural information which cannot be observed by two-dimensional imaging. By combining annular dark field scanning transmission electron microscopy (ADF-STEM) with aberration correction, the resolution of electron tomography has reached atomic resolution. However, tomography based on ADF-STEM inherently suffers from several issues, including a high electron dose requirement, poor contrast for light elements, and artifacts from image contrast nonlinearity. Here, we developed a new method called MultiSlice Electron Tomography (MSET) based on 4D-STEM tilt series. Our simulations show that multislice-based 3D reconstruction can effectively reduce undesirable reconstruction artifacts from the nonlinear contrast, allowing precise determination of atomic structures with improved sensitivity for low-Z elements, at considerably low electron dose conditions. We expect that the MSET method can be applied to a wide variety of materials, including radiation-sensitive samples and materials containing light elements whose 3D atomic structures have never been fully elucidated due to electron dose limitations or nonlinear imaging contrast.