计算机科学
加速寿命试验
可靠性工程
工程类
数学
统计
威布尔分布
标识
DOI:10.1109/rams51492.2024.10457638
摘要
Highly Accelerated Life Testing (HALT), Highly Accelerated Stress Screening (HASS), and Accelerated Aging tests can improve reliability and reduce costs when performed correctly. In the context of this paper, HALT and HASS is performed on any component or assembly that will see field service. Accelerated Aging Testing is performed on assemblies that will see extended periods of storage prior to use. This paper examines some common and not-so-common mistakes that can jeopardize success of these tests. Lessons learned from test planning, pre-test assumptions, test setup, conduct of the tests, and post-test analyses are summarized. Team organization, optimal level of assembly, thermal and stress analysis, test fixture design, test environmental profiles, test chamber considerations, data collection, and post-test analyses are discussed. Effective testing is essential to achieving best results. Avoiding these pitfalls will ensure a cost effective test program that results in fielding a reliable product.
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