材料科学
氮化物
光电子学
转印
纳米技术
外延
发光二极管
范德瓦尔斯力
剥脱关节
石墨烯
复合材料
图层(电子)
化学
有机化学
分子
作者
Wurui Song,Qi Chen,Kailai Yang,Meng Li,Xiaoyan Yi,Junxi Wang,Jinmin Li,Zhiqiang Liu
标识
DOI:10.1002/adfm.202209880
摘要
Abstract Group III‐nitrides have attracted significant attention in recent years for their wide tunable band‐gaps and excellent optoelectronic capabilities, which are advantageous for several applications including light‐emitting diodes, lasers, photodetectors, and large‐size low‐cost power electronic devices. However, conventional epitaxy accompanied by the covalent bond formation renders the transfer of nitride epilayers difficult, thereby limiting the application potential of nitrides in wearable and flexible electronics. Furthermore, interfacial covalent bonds also limit substrate selection and hinder the development of heterogeneous integration between nitrides and other material systems. 2D materials can mitigate these problems significantly. On the one hand, due to the weak van der Waals forces between the layers of 2D materials, influences of lattice mismatch can be avoided to improve crystal quality. On the other hand, delamination and transfer of nitride epilayers can be achieved easily. Therefore, this study focuses on providing comprehensive guidelines regarding the exfoliation of epitaxial layers using 2D materials to provide new design freedoms for nitride devices. Different 2D buffers and release layers have also been discussed. Furthermore, the limitations, promising solutions, future directions, and applicability of this strategy to flexible nitride devices are presented.
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