Birefringence in the Polarized Raman Scattering of Biaxial van der Waals α‐MoO3

Abstract The effect of birefringence in anisotropic materials has been a long‐term issue for polarized Raman scattering. In this work, the polarization‐dependent Raman scattering in anisotropically birefringent materials is modeled with birefringence considered in the fundamental polarization selection rule. The birefringence‐induced polarization transformation is treated as a tensor in the calculation of Raman scattering intensity. The validity of this theory is further demonstrated in experiments by taking angle‐resolved polarized Raman measurements on the basal and cross planes of α‐MoO 3 —a typical biaxial van der Waals crystal with strong in‐plane and out‐of‐plane anisotropy. The anomalous angular dependency of polarized Raman scattering intensity can be well reproduced by the modified theoretical model with fitted real‐valued Raman tensors and birefringence‐related parameters. It can be concluded that this work can provide a valuable reference and guidance for quantitative analyses of anisotropic materials by using polarization‐resolved Raman scattering spectroscopy.