原子力显微镜
生物力学
角膜
显微镜
巩膜
纳米尺度
纳米技术
材料科学
导电原子力显微镜
光学
生物医学工程
眼科
物理
解剖
医学
作者
Xiaoyun Zhu,Xiaoming Yan
出处
期刊:Int Rev Ophthalmol
日期:2013-06-22
卷期号:37 (03): 148-152
标识
DOI:10.3760/cma.j.issn.1673-5803.2013.03.002
摘要
This review briefly introduces the principles of the atomic force microscopy (AFM) and its applications in ophthalmology.The AFM is an instrument that traces the surface topography of a sample with a sharp probe,while monitoring the interaction forces working between the probe and the sample surface.With AFM,the three-dimensional image of the surface can be obtained in nearly physiological conditions at a nanoscale resolution,as well as the biomechanics of the sample.The domains of AFM application have increased dramatically in recent years,from single molecules to organs.In ophthalmology,AFM demonstrates great advantages in the studies on eye microstructures and biomechanical properties,such as the cornea,sclera and lens.Although there are some innate limitations for AFM imaging and biomechanics measurement,AFM has great potential for providing valuable new informations in ophthalmology.
Key words:
atomic force microscopy ; three-dimensional image ; biomechanics
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