Binary Semiconductors Thin Films Characterization for Solar Cells Applications

The increasing development of technologies based on the thin films, imposed a high quality of these films. The crucial importance for all applications of thin films is related to the stability of their physical and morphological properties. Therefore, to optimize the performances of the thin films it is recommended to study carefully all their parameters in order to enhance the elaborated films. With this intention, various characterizations methods were developed and carried out to study the different qualities of thin films. In this chapter, we take an interest to the study of the characteristics of some binary semiconductors thin films elaborated by ultrasonic spray pyrolysis, and which are destined for solar cells applications. Several used characterizations techniques to the determination of the thin films properties will be given; namely: X-rays diffraction (XRD), Scanning Electron Microscopy (SEM), EDS (Energy Dispersive Spectroscopy), Hall effect and spectrophotometry will be discussed in detail.