物理
各向异性
微晶
纹理(宇宙学)
方向(向量空间)
衍射
中子衍射
同步加速器
再结晶(地质)
测角仪
电子背散射衍射
结晶学
凝聚态物理
光学
几何学
人工智能
图像(数学)
生物
计算机科学
古生物学
化学
数学
作者
H-R Wenk,P. Van Houtte
标识
DOI:10.1088/0034-4885/67/8/r02
摘要
A large number of polycrystalline materials, both manmade and natural, display preferred orientation of crystallites. Such alignment has a profound effect on anisotropy of physical properties. Preferred orientation or texture forms during growth or deformation and is modified during recrystallization or phase transformations and theories exist to predict its origin. Different methods are applied to characterize orientation patterns and determine the orientation distribution, most of them relying on diffraction. Conventionally x-ray pole-figure goniometers are used. More recently single orientation measurements are performed with electron microscopes, both SEM and TEM. For special applications, particularly texture analysis at non-ambient conditions, neutron diffraction and synchrotron x-rays have distinct advantages. The review emphasizes such new possibilities.
科研通智能强力驱动
Strongly Powered by AbleSci AI