铁电性
压电响应力显微镜
材料科学
量子隧道
隧道枢纽
电阻式触摸屏
极化(电化学)
凝聚态物理
导电原子力显微镜
光电子学
纳米技术
原子力显微镜
化学
电介质
物理
电气工程
工程类
物理化学
作者
Arnaud Crassous,Vincent Garcia,K. Bouzéhouane,S. Fusil,A.H.G. Vlooswijk,Gijsbert Rispens,Beatriz Noheda,M. Bibes,A. Barthélémy
摘要
The persistency of ferroelectricity in ultrathin films allows their use as tunnel barriers. Ferroelectric tunnel junctions are used to explore the tunneling electroresistance effect—a change in the electrical resistance associated with polarization reversal in the ferroelectric barrier layer—resulting from the interplay between ferroelectricity and quantum-mechanical tunneling. Here, we use piezoresponse force microscopy and conductive-tip atomic force microscopy at room temperature to demonstrate the resistive readout of the polarization state through its influence on the tunnel current in PbTiO3 ultrathin ferroelectric films. The tunnel electroresistance reaches values of 50 000% through a 3.6 nm PbTiO3 film.
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