电催化剂
材料科学
X射线光电子能谱
纳米线
透射电子显微镜
化学工程
肖特基势垒
纳米颗粒
电化学
纳米技术
分析化学(期刊)
物理化学
电极
化学
光电子学
二极管
色谱法
工程类
作者
Shipra Chauhan,Toshiyuki Mori,Takuya Masuda,Shigenori Ueda,Gary J. Richards,Jonathan P. Hill,Katsuhiko Ariga,Noriko Isaka,Graeme Auchterlonie,John Drennan
标识
DOI:10.1021/acsami.5b12469
摘要
Pt-CeO(x) nanowire (NW)/C electrocatalysts for the improvement of oxygen reduction reaction (ORR) activity on Pt were prepared by a combined process involving precipitation and coimpregnation. A low, 5 wt % Pt-loaded CeO(x) NW/C electrocatalyst, pretreated by an optimized electrochemical conditioning process, exhibited high ORR activity over a commercially available 20 wt % Pt/C electrocatalyst although the ORR activity observed for a 5 wt % Pt-loaded CeO(x) nanoparticle (NP)/C was similar to that of 20 wt % Pt/C. To investigate the role of a CeO(x) NW promotor on the enhancement of ORR activity on Pt, the Pt-CeO(x) NW interface was characterized by using hard X-ray photoelectron spectroscopy (HXPS), transmission electron microscopy (TEM), and electron energy loss spectroscopy (EELS). Microanalytical data obtained by these methods were discussed in relation to atomistic simulation performed on the interface structures. The combined techniques of HXPS, TEM-EELS, and atomistic simulation indicate that the Pt-CeO(x) NW interface in the electrocatalyst contains two different defect clusters: Frenkel defect clusters (i.e., 2Pt(i)(••) - 4O(i)″ - 4V(o)(••) - V(Ce)″″) formed in the surface around the Pt-CeO(x) NW interface and Schottky defect clusters (i.e., (Pt(Ce)″ - 2V(O)(••) - 2Ce(Ce)') and (Pt(Ce)″ - V(O)(••))) which appear in the bulk of the Pt-CeO(x) NW interface similarly to Pt-CeO(x) NP/C. It is concluded that the formation of both Frenkel defect clusters and Schottky defect clusters at the Pt-CeO(x) NW heterointerface contributes to the promotion of ORR activity and permits the use of lower Pt-loadings in these electrocatalysts.
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