电子断层摄影术
断层摄影术
晶体缺陷
堆积
断层重建
电子
晶界
点(几何)
材料科学
物理
计算机科学
结晶学
电子显微镜
化学
扫描透射电子显微镜
凝聚态物理
几何学
光学
核磁共振
数学
微观结构
量子力学
作者
Jianwei Miao,Peter Ercius,Simon J. L. Billinge
出处
期刊:Science
[American Association for the Advancement of Science (AAAS)]
日期:2016-09-22
卷期号:353 (6306)
被引量:236
标识
DOI:10.1126/science.aaf2157
摘要
Crystallography has been fundamental to the development of many fields of science over the last century. However, much of our modern science and technology relies on materials with defects and disorders, and their three-dimensional (3D) atomic structures are not accessible to crystallography. One method capable of addressing this major challenge is atomic electron tomography. By combining advanced electron microscopes and detectors with powerful data analysis and tomographic reconstruction algorithms, it is now possible to determine the 3D atomic structure of crystal defects such as grain boundaries, stacking faults, dislocations, and point defects, as well as to precisely localize the 3D coordinates of individual atoms in materials without assuming crystallinity. Here we review the recent advances and the interdisciplinary science enabled by this methodology. We also outline further research needed for atomic electron tomography to address long-standing unresolved problems in the physical sciences.
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