High reflectivity surface highlight removal technology based on light field polarization imaging

This paper proposes an imaging technique to remove strong reflections from specular surfaces using polarization characteristics combined with light field imaging. Firstly, the correct strong reflection region is found by studying the reflected light characteristics, and the strong reflection region highlights are filtered out using Stokes parameters based on polarization information. Then, a system of microlens arrays with different transmittances was built for imaging, and the system was image-corrected to enable more information about the scene to be captured. Finally, the color statistics are corrected according to the color characteristics, and then the color adjustment is performed to enhance the local color transfer results to obtain a high-quality true color image. The results of the experiment suggest that the method proposed in this paper is effective in restoring the actual texture contours of large highlight regions on strongly reflective surfaces.