硅烷
X射线光电子能谱
分子
化学
扫描隧道显微镜
金属
部分
结晶学
密度泛函理论
材料科学
纳米技术
计算化学
立体化学
化学工程
有机化学
工程类
作者
Peizhen Liu,Tiantong Zhang,Ji Zhang,Peichao Wang,Hongchao Wang,You Han,Dongbing Zhao,Hong‐Ying Gao
标识
DOI:10.1021/acs.jpcc.4c07936
摘要
The structure of bis(catecholato)silane has been subject to debate, as to whether it is its tetrahedral or planar Si(IV). To tackle the discussion, here, the bis(catecholato)silane molecules with visible molecular-level images on different metal surfaces are investigated by scanning tunneling microscopy (STM), X-ray photoelectron spectroscopy (XPS), and density functional theory (DFT) simulations. It is found that the bis(catecholato)silane shows a tetrahedral Si(IV) structure on both Au(111) and Ag(111) surfaces, while the bis(catecholato)silane can show a nearly planar Si(IV) structure on the Cu(111) surface due to the strong interaction between the SiO4 moiety and the metal surface. Naturally, the conformational difference results in the self-assembly and on-surface chemistry behaving differently. Furthermore, the coverage of bis(catecholato)silane influences the self-assembly structures, indicating that the interactions among organic molecules affect the molecular tetrahedral or planar conformations. Our study reveals fundamental knowledge of the bis(catecholato)silane molecules on a surface, especially the tetrahedral or planar Si(IV) selectivity influenced by the surface constraint.
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