材料科学
纳米线
单斜晶系
半导体
带隙
小型化
纳米尺度
相(物质)
纳米技术
MOSFET
场效应晶体管
兴奋剂
光电子学
镓
透射电子显微镜
相变
晶体管
磷化镓
凝聚态物理
结晶学
化学
晶体结构
物理
有机化学
量子力学
电压
冶金
作者
Jiaheng Wang,Xiaoxi Guan,Zheng He,Ligong Zhao,Renhui Jiang,Peili Zhao,Ying Zhang,Jie Hu,Pei Li,Shuangfeng Jia,Jianbo Wang
出处
期刊:Nano Letters
[American Chemical Society]
日期:2023-08-02
卷期号:23 (16): 7364-7370
被引量:2
标识
DOI:10.1021/acs.nanolett.3c01751
摘要
Gallium oxide (Ga2O3) has attracted extensive attention as a potential candidate for low-dimensional metal-oxide-semiconductor field-effect transistors (MOSFETs) due to its wide bandgap, controllable doping, and low cost. The structural stability of nanoscale Ga2O3 is the key parameter for designing and constructing a MOSFET, which however remains unexplored. Using in situ transmission electron microscopy, we reveal the size-dependent phase transition of sub-2 nm Ga2O3 nanowires. Based on theoretical calculations, the transformation pathways from the initial monoclinic β-phase to an intermediate cubic γ-phase and then back to the β-phase have been mapped and identified as a sequence of Ga cation migrations. Our results provide fundamental insights into the Ga2O3 phase stability within the nanoscale, which is crucial for advancing the miniaturization, light weight, and integration of wide-bandgap semiconductor devices.
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