光电阴极
硫族元素
硫系化合物
空位缺陷
硫黄
光电流
化学气相沉积
材料科学
锑
钝化
氢
沉积(地质)
分析化学(期刊)
光电子学
化学
图层(电子)
纳米技术
结晶学
冶金
电子
物理
有机化学
量子力学
色谱法
生物
古生物学
沉积物
作者
Weitao Qiu,Renbo Lei,Xing Tang,Yupu Tang,Xianzhen Huang,Kai Zhang,Ziqiong Lin,Shuang Xiao,Xinwei Wang,Shihe Yang
出处
期刊:Solar RRL
[Wiley]
日期:2024-01-08
卷期号:8 (5)
被引量:7
标识
DOI:10.1002/solr.202300876
摘要
Chalcogen vacancy has long been recognized as a detrimental deep‐level defect that can induce severe charge recombination and diminish the quasi‐Fermi‐level splitting in Sb 2 S 3 and Sb 2 Se 3 , especially when they are prepared by physical vapor deposition in vacuum. In order to counter this limitation, a sulfur‐supplemented vapor transport deposition technique is proposed, which intentionally introduces low pressure sulfur vapor and can thus afford low‐defect‐density antimony chalcogenide films. The resultant photocathodes modified with conformal TiO 2 protection layer and Pt cocatalyst demonstrate a photocurrent as high as 20 mA cm −2 along with a much improved fill factor and onset potential, achieving an applied bias photoconversion efficiency above 1%. This work highlights the importance of the vacancy defect passivation and the preferential crystalline orientation in the film in promoting the photocathode performance.
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