深度学习
人工智能
计算机科学
自动化
背景(考古学)
计算机视觉
机器学习
模式识别(心理学)
图像(数学)
目标检测
图像处理
曲面(拓扑)
工程类
数学
几何学
生物
古生物学
机械工程
作者
Prahar M. Bhatt,Rishi K. Malhan,Pradeep Rajendran,Brual C. Shah,Shantanu Thakar,Yeo Jung Yoon,Satyandra K. Gupta
出处
期刊:Journal of Computing and Information Science in Engineering
[ASME International]
日期:2021-01-10
卷期号:21 (4)
被引量:163
摘要
Abstract Automatically detecting surface defects from images is an essential capability in manufacturing applications. Traditional image processing techniques are useful in solving a specific class of problems. However, these techniques do not handle noise, variations in lighting conditions, and backgrounds with complex textures. In recent times, deep learning has been widely explored for use in automation of defect detection. This survey article presents three different ways of classifying various efforts in literature for surface defect detection using deep learning techniques. These three ways are based on defect detection context, learning techniques, and defect localization and classification method respectively. This article also identifies future research directions based on the trends in the deep learning area.
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