材料科学
相变
半导体
固体物理学
相(物质)
快离子导体
硫系化合物
薄膜
拉曼光谱
作者
A. V. Il’inskii,René Castro,M. E. Pashkevich,I. O. Popova,E. B. Shadrin
标识
DOI:10.1134/s1063783420120136
摘要
The frequency dependences of the dielectric loss tangent tan δ( f ) and the Cole–Cole diagrams of silver sulfide thin films are studied at various temperatures in the range 0–200°C. The experimental data are compared to the calculation of the complex impedance of the electric circuit proposed for Ag2S-containing samples before and after the temperature semiconductor–superionic phase transition. A microscopic model of the phase transition in Ag2S is proposed on the base of the analysis of obtained results and literature data.
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