杰纳斯
单层
点反射
凝聚态物理
范德瓦尔斯力
对称性破坏
不对称
材料科学
偶极子
半导体
石墨烯
纳米技术
过渡金属
化学物理
化学
光电子学
物理
分子
有机化学
催化作用
量子力学
生物化学
作者
Ang‐Yu Lu,Hanyu Zhu,Jun Xiao,Chih‐Piao Chuu,Yimo Han,Ming‐Hui Chiu,Chia-Chin Cheng,Chih‐Wen Yang,Kung‐Hwa Wei,Yiming Yang,Yuan Wang,Dimosthenis Sokaras,Dennis Nordlund,Peidong Yang,David A. Muller,M. Y. Chou,Xiang Zhang,Lain‐Jong Li
标识
DOI:10.1038/nnano.2017.100
摘要
A novel synthetic approach makes it possible to grow MoS2 monolayers where S is fully replaced with Se atoms only in the top layer. Structural symmetry-breaking plays a crucial role in determining the electronic band structures of two-dimensional materials. Tremendous efforts have been devoted to breaking the in-plane symmetry of graphene with electric fields on AB-stacked bilayers1,2 or stacked van der Waals heterostructures3,4. In contrast, transition metal dichalcogenide monolayers are semiconductors with intrinsic in-plane asymmetry, leading to direct electronic bandgaps, distinctive optical properties and great potential in optoelectronics5,6. Apart from their in-plane inversion asymmetry, an additional degree of freedom allowing spin manipulation can be induced by breaking the out-of-plane mirror symmetry with external electric fields7,8 or, as theoretically proposed, with an asymmetric out-of-plane structural configuration9. Here, we report a synthetic strategy to grow Janus monolayers of transition metal dichalcogenides breaking the out-of-plane structural symmetry. In particular, based on a MoS2 monolayer, we fully replace the top-layer S with Se atoms. We confirm the Janus structure of MoSSe directly by means of scanning transmission electron microscopy and energy-dependent X-ray photoelectron spectroscopy, and prove the existence of vertical dipoles by second harmonic generation and piezoresponse force microscopy measurements.
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