掺杂剂
晶体管
量子隧道
硅
半导体
材料科学
星团(航天器)
光电子学
氧化物
工程物理
化学物理
纳米技术
凝聚态物理
兴奋剂
化学
电气工程
物理
计算机科学
冶金
工程类
电压
程序设计语言
出处
期刊:Science
[American Association for the Advancement of Science (AAAS)]
日期:1999-09-24
卷期号:285 (5436): 2079-2081
被引量:381
标识
DOI:10.1126/science.285.5436.2079
摘要
For the past 30 years, transistor performance and density have doubled every 3 years, but now fundamental thermodynamic limits are being reached in critical areas, and unless new, innovative solutions are found, the current rate of improvement cannot be maintained. Exceeding the maximum thermodynamically stable concentration of dopant atoms in silicon leads to diminished performance as dopant atoms cluster; electron tunneling prohibits reductions in gate oxide thickness; and the transistor dimensions have become so small that small changes in the exact number and distribution of dopant atoms can cause appreciable changes in the device behavior. There are currently no known solutions to these problems, providing a serious challenge for the semiconductor industry.
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