溶剂化电子
电子
反应性(心理学)
抵抗
化学
产量(工程)
电子束处理
辐照
放射分析
阴极射线
分解
分析化学(期刊)
原子物理学
材料科学
物理化学
物理
水溶液
有机化学
核物理学
图层(电子)
医学
替代医学
病理
冶金
作者
Kenichiro Natsuda,Takahiro Kozawa,Kazumasa Okamoto,Akinori Saeki,Seiichi Tagawa
标识
DOI:10.1143/jjap.48.06fc05
摘要
The decomposition efficiency of acid generators upon exposure to ionizing radiation such as an electron beam is mainly determined by the reactivity of acid generators with thermalized electrons. The reactivity has been estimated using solvated electrons generated in solutions because there has been no method to directly observe the reaction with thermalized electrons generated in resist films. However, the reactivity estimated from the reaction with solvated electrons does not have sufficient accuracy to reproduce the difference between acid generators. In this study, we investigated the relationship between the acid yield and C37 parameter of acid generators. The C37 parameter was evaluated using tetrahydrofuran solution. The C37 parameter has been believed to reflect the reaction of solutes with presolvated electrons generated in solutions. It was found that the C37 parameter correlates with acid yields measured in resist films.
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