通量
钻石
光电子学
激光器
辐射硬化
辐照
材料科学
准分子激光器
光电探测器
辐射
钝化
光学
烧蚀
辐射损伤
准分子
紫外线
纳米技术
复合材料
图层(电子)
物理
工程类
航空航天工程
核物理学
作者
Michael D. Whitfield,Stuart P. Lansley,Olivier Gaudin,Robert D. McKeag,Nadeem Hasan Rizvi,Richard B. Jackman
标识
DOI:10.1016/s0925-9635(00)00574-4
摘要
The first study of long term pulse exposure and fluence level on the performance of CVD diamond photodetectors subjected to 193 nm excimer laser radiation has been performed. Whilst diamond is considered ‘radiation hard’ it is shown that damage to detector performance can be provoked at laser fluence levels considerably below that required for graphitisation or ablation. However, the application of defect passivation treatments prior to device use acts to considerably reduce the damaging effect of the radiation, such that devices suitable for stable laser monioring applications can be realised.
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