显微镜
扫描隧道显微镜
扫描探针显微镜
原子力显微镜
磁力显微镜
分辨率(逻辑)
导电原子力显微镜
扫描霍尔探针显微镜
材料科学
扫描离子电导显微镜
显微镜
纳米技术
物理
扫描共焦电子显微镜
常规透射电子显微镜
光学
扫描透射电子显微镜
计算机科学
人工智能
磁化
量子力学
透射电子显微镜
磁场
作者
D. Rugar,Paul K. Hansma
出处
期刊:Physics Today
[AIP Publishing]
日期:1990-10-01
卷期号:43 (10): 23-30
被引量:555
摘要
In 1986 Gerd Binnig and Heinrich Rohrer shared the Nobel Prize in Physics for inventing the scanning tunneling microscope and discovering that it can image individual surface atoms with unprecedented resolution. The success of the scanning tunneling microscope has led to the invention of a host of other “scanning probe” microscopes, which rely on mechanically scanning a sharp tip over a sample surface. The atomic force microscope is one of the most successful of these new devices.
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