电子断层摄影术
材料科学
扫描透射电子显微镜
多模光纤
纳米技术
纳米颗粒
断层摄影术
金属
光学
电子
透射电子显微镜
冶金
光纤
核物理学
物理
作者
Kellie Jenkinson,Luis M. Liz‐Marzán,Sara Bals
标识
DOI:10.1002/adma.202110394
摘要
Electron tomography has become a cornerstone technique for the visualization of nanoparticle morphology in three dimensions. However, to obtain in-depth information about a nanoparticle beyond surface faceting and morphology, different electron microscopy signals must be combined. The most notable examples of these combined signals include annular dark-field scanning transmission electron microscopy (ADF-STEM) with different collection angles and the combination of ADF-STEM with energy-dispersive X-ray or electron energy loss spectroscopies. Here, the experimental and computational development of various multimode tomography techniques in connection to the fundamental materials science challenges that multimode tomography has been instrumental to overcoming are summarized. Although the techniques can be applied to a wide variety of compositions, the study is restricted to metal and metal oxide nanoparticles for the sake of simplicity. Current challenges and future directions of multimode tomography are additionally discussed.
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