热电偶
碳化硅
材料科学
微电子机械系统
绝缘体上的硅
光电子学
欧姆接触
电子工程
硅带隙温度传感器
温度测量
宽禁带半导体
硅
电气工程
电压
纳米技术
复合材料
工程类
物理
跌落电压
量子力学
分压器
图层(电子)
作者
Yudong Lv,Ailun Yi,Yi Wang,Hong Zhou,Xin Ou,Tie Li
出处
期刊:IEEE Sensors Journal
[Institute of Electrical and Electronics Engineers]
日期:2022-07-15
卷期号:22 (14): 13930-13936
被引量:4
标识
DOI:10.1109/jsen.2022.3181046
摘要
With the high thermal conductivity and breakdown voltage, silicon carbide (SiC) has been treated as a promising material to work in harsh environment especially high temperature. However, due to its chemical inertness and wide band-gap, it is difficult to achieve the ion implantation, etching and good ohmic contact. In this study, silicon carbide on insulator (4H-SiCOI) is applied to fabricate MEMS thermocouple sensor, which can simultaneously compatible with bulk silicon CMOS process. The stress and temperature distribution of the sensor was simulated by COMSOL. After optimized the process parameters, the sensor based on 4H-SiCOI was successfully fabricated. Preliminary test results demonstrated the sensor shows good sensitivity about 1.44 $\times 10^{-{8}}\,\,{V}{m}^{{{2}}}/{W}$ and response time of 3.24ms, which also keeps good linearity and repeatability. This sensor can satisfy the needs of fast and high precision heat detection and our work may have a meaningful reference value for other same type SiC-based MEMS thermocouple sensor design and preparation.
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