可靠性(半导体)
试验计划
考试(生物学)
可靠性工程
平面图(考古学)
压力(语言学)
计算机科学
推论
加速寿命试验
运筹学
工程类
人工智能
统计
数学
地理
古生物学
哲学
功率(物理)
考古
威布尔分布
语言学
物理
生物
量子力学
作者
Xiangxiang Zhang,Jun Yang,Xuefeng Kong
出处
期刊:Recent Patents on Engineering
[Bentham Science]
日期:2019-12-09
卷期号:15 (1): 12-21
被引量:3
标识
DOI:10.2174/1872212113666191209150647
摘要
Background: Multi-stress accelerated life test (MALT) has obtained increasing attention in reliability assessment due to its advantages. Started with constant-stress ALT with two stress variables, MALT has developed a lot during the past decades. In MALT, the design of the test plan and data analysis are two crucial aspects. Numerous researchers have discussed these two aspects and some important methods of planning and data analysis for MALT are presented. Methods: We first conducted a survey in the journal databases including Elsevier, Springer, IEEEXplore, Wiley and Taylor & Francis; and patent databases like Spacenet, USPTO and WIPO. Then we revised the literature including patents comprehensively on the planning and analysis of multistress ALT. Results: Optimal designs for MALT under different stress loadings are summarized, and different types of statistical inference methods are categorized and introduced. Finally, some challenges and research trends are discussed for future study.
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