材料科学
碳化硅
氮化镓
欧姆接触
功率半导体器件
宽禁带半导体
工程物理
光电子学
电力电子
半导体
可靠性(半导体)
数码产品
二极管
半导体器件
纳米技术
电气工程
功率(物理)
电压
工程类
冶金
量子力学
物理
图层(电子)
作者
Sadhana Singh,Tarun Chaudhary,Gargi Khanna
出处
期刊:Silicon
[Springer Science+Business Media]
日期:2021-09-13
卷期号:14 (11): 5793-5800
被引量:29
标识
DOI:10.1007/s12633-021-01362-3
摘要
Wide bandgap (WBG) semiconductor materials have the capability of making power electronic components with a smaller size, faster switching speed, more reliability, and greater efficiency than their silicon-based counterparts. Real progress in the field of power electronics occurred when WBG devices came into use. Reportedly, among the various WBG semiconductors, gallium nitride (GaN) and silicon carbide (4 H-SiC) are perceived for the future of power electronics as excellent materials. The purpose of this chapter is to analyze some recent progress in WBG semiconductor power devices (e.g. diodes, MOSFETs, HEMTs, etc.). The emphasis is made on particularly important issues, such as SiC MOSFETs channel mobility, ohmic contacts in SiC devices, and the strategies for normally-off GaN HEMTs. An outline of the key challenges and a brief insight into the upcoming aspects of ultra-high-voltage SiC devices and GaN vertical devices has been provided in the end.
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