材料科学
范德瓦尔斯力
半金属
光电探测器
暗电流
光电子学
光探测
肖特基势垒
场效应晶体管
比探测率
光电效应
石墨烯
功勋
晶体管
二极管
物理
纳米技术
带隙
分子
电压
量子力学
作者
Chaoyi Zhang,Silu Peng,Jiayue Han,Chunyu Li,Hongxi Zhou,He Yu,Jun Gou,Chao Chen,Yadong Jiang,Jun Wang
标识
DOI:10.1002/adfm.202302466
摘要
Abstract Due to its unique band structure and topological properties, the 2D topological semimetal exhibits potential applications in photoelectric detection, polarization sensitive imaging, and Schottky barrier diodes. However, its inherent large dark current hinders the further improvement of the performance of the semimetal‐based photodetectors. In this study, a van der Waals (vdWs) field effect transistor (FET) composed of semimetal PdTe 2 and transition metal dichalcogenides (TMDs) WSe 2 is fabricated, which exhibits high sensitivity photoelectric detection performance in a wide band from visible light (405 nm) to mid‐infrared (5 µm). The dark current and the noise level in the device are greatly suppressed by the effective control of the gate. Benefiting from the extremely low dark current (1.2 pA), the device achieves an optical on/off ratio up to 10 6 , a high detectivity of 9.79 × 10 13 Jones and a rapid response speed (219 and 45 µs). This research demonstrates the latent capacity of the 2D topological semimetal/TMDs vdWs FET for broadband, high‐performance, and miniaturized photodetection.
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